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  E-mail Message: I thought you might be interested in this item at http://scripps-libraries.worldcat.org/oclc/248979308 Title: Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Author: Patrick Echlin Publisher: New York : Springer, ©2009. ISBN/ISSN: 9780387857305 0387857303 OCLC:248979308

  
  

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Subjects

• Scanning electron microscopy -- Technique.
• X-ray microanalysis -- Technique.
• Scanning electron microscopy.
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Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis

Author:	Patrick Echlin
Publisher:	New York : Springer, ©2009.
Edition/Format:	Book : EnglishView all editions and formats
Summary:	Here is a complete guide to preparing a variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors.  Read more...